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Link to original content: https://dblp.dagstuhl.de/rec/conf/case/KammSJW21.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/case/KammSJW21 AU - Kamm, Simon AU - Sharma, Kanuj AU - Jazdi, Nasser AU - Weyrich, Michael TI - A Hybrid Modelling Approach for Parameter Estimation of Analytical Reflection Models in the Failure Analysis Process of Semiconductors. BT - 17th IEEE International Conference on Automation Science and Engineering, CASE 2021, Lyon, France, August 23-27, 2021 SP - 417 EP - 422 PY - 2021// DO - 10.1109/CASE49439.2021.9551454 UR - https://doi.org/10.1109/CASE49439.2021.9551454 ER -