Simon Kamm et al.: A Hybrid Modelling Approach for Parameter Estimation of Analytical Reflection Models in the Failure Analysis Process of Semiconductors. (2021)conf/case/KammSJW2110.1109/CASE49439.2021.9551454A Hybrid Modelling Approach for Parameter Estimation of Analytical Reflection Models in the Failure Analysis Process of Semiconductors.4Simon Kamm1Kanuj Sharma2Nasser Jazdi3Michael Weyrich4417-422CASECASE20212021provenance information for RDF data of dblp record 'conf/case/KammSJW21'2021-10-08T19:47:36+0200