BibTeX record conf/amcc/MerryUKMVS08

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@inproceedings{DBLP:conf/amcc/MerryUKMVS08,
  author       = {Roel J. E. Merry and
                  Mustafa Uyanik and
                  Richard K. Koops and
                  Ren{\'{e}} van de Molengraft and
                  Marijn van Veghel and
                  Maarten Steinbuch},
  title        = {Modeling, identification and control of a metrological Atomic Force
                  Microscope with a 3DOF stage},
  booktitle    = {American Control Conference, {ACC} 2008, Seattle, WA, USA, 11-13 June
                  2008},
  pages        = {2716--2721},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/ACC.2008.4586903},
  doi          = {10.1109/ACC.2008.4586903},
  timestamp    = {Fri, 03 Dec 2021 13:02:23 +0100},
  biburl       = {https://dblp.org/rec/conf/amcc/MerryUKMVS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}