{"id":"https://openalex.org/W3012374719","doi":"https://doi.org/10.3390/s20061562","title":"Deep Metallic Surface Defect Detection: The New Benchmark and Detection Network","display_name":"Deep Metallic Surface Defect Detection: The New Benchmark and Detection Network","publication_year":2020,"publication_date":"2020-03-11","ids":{"openalex":"https://openalex.org/W3012374719","doi":"https://doi.org/10.3390/s20061562","mag":"3012374719","pmid":"https://pubmed.ncbi.nlm.nih.gov/32168887","pmcid":"https://www.ncbi.nlm.nih.gov/pmc/articles/7146379"},"language":"en","primary_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20061562","pdf_url":"https://www.mdpi.com/1424-8220/20/6/1562/pdf","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},"type":"article","type_crossref":"journal-article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/20/6/1562/pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049801654","display_name":"Xiaoming Lv","orcid":"https://orcid.org/0000-0001-9964-5287"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoming Lv","raw_affiliation_strings":["The State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China;"],"affiliations":[{"raw_affiliation_string":"The State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China;","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081309310","display_name":"Fajie Duan","orcid":"https://orcid.org/0000-0002-2151-0785"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fajie Duan","raw_affiliation_strings":["The State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China;"],"affiliations":[{"raw_affiliation_string":"The State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China;","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035473587","display_name":"Jiajia Jiang","orcid":"https://orcid.org/0000-0002-0611-6501"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia-jia Jiang","raw_affiliation_strings":["The State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China;"],"affiliations":[{"raw_affiliation_string":"The State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China;","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046959714","display_name":"Xiao Fu","orcid":"https://orcid.org/0000-0002-2221-2878"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao Fu","raw_affiliation_strings":["The State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China;"],"affiliations":[{"raw_affiliation_string":"The State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China;","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038750675","display_name":"Lin Gan","orcid":"https://orcid.org/0000-0003-1297-4462"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lin Gan","raw_affiliation_strings":["The State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China;"],"affiliations":[{"raw_affiliation_string":"The State Key Lab of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China;","institution_ids":["https://openalex.org/I162868743"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598,"provenance":"doaj"},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598,"provenance":"doaj"},"fwci":24.355,"has_fulltext":true,"fulltext_origin":"pdf","cited_by_count":229,"citation_normalized_percentile":{"value":0.999916,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"20","issue":"6","first_page":"1562","last_page":"1562"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Fabric Defect Detection in Industrial Applications","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Fabric Defect Detection in Industrial Applications","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Techniques Based on Eddy Current Testing","score":0.9794,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9717,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.72433513},{"id":"https://openalex.org/keywords/surface-defect-detection","display_name":"Surface Defect Detection","score":0.64618},{"id":"https://openalex.org/keywords/defect-detection","display_name":"Defect Detection","score":0.633051},{"id":"https://openalex.org/keywords/fabric-defect-detection","display_name":"Fabric Defect Detection","score":0.582061},{"id":"https://openalex.org/keywords/wafer-map-defect-classification","display_name":"Wafer Map Defect Classification","score":0.526994}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.72433513},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.66590106},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.60054916},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5773655},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.54123574},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5142069},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.48341},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4715236},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.44901603},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3454929},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":6,"locations":[{"is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20061562","pdf_url":"https://www.mdpi.com/1424-8220/20/6/1562/pdf","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},{"is_oa":false,"landing_page_url":"https://doaj.org/article/a01ff63a097e41d49d45177155e8ac38","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},{"is_oa":true,"landing_page_url":"https://europepmc.org/articles/pmc7146379","pdf_url":"https://europepmc.org/articles/pmc7146379?pdf=render","source":{"id":"https://openalex.org/S4306400806","display_name":"Europe PMC (PubMed Central)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1303153112","host_organization_name":"European Bioinformatics Institute","host_organization_lineage":["https://openalex.org/I1303153112"],"host_organization_lineage_names":["European Bioinformatics Institute"],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},{"is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7146379","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":["National Institutes of Health"],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true},{"is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/s20061562","pdf_url":"https://www.mdpi.com/1424-8220/20/6/1562/pdf?version=1584704455","source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute (Switzerland)"],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false},{"is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/32168887","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":["National Institutes of Health"],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20061562","pdf_url":"https://www.mdpi.com/1424-8220/20/6/1562/pdf","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},"sustainable_development_goals":[],"grants":[{"funder":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China","award_id":"2017YFF0204800"}],"datasets":[],"versions":[],"referenced_works_count":32,"referenced_works":["https://openalex.org/W1221208146","https://openalex.org/W1487583988","https://openalex.org/W1861492603","https://openalex.org/W1967160092","https://openalex.org/W1986306729","https://openalex.org/W2012496675","https://openalex.org/W2070407351","https://openalex.org/W2092072518","https://openalex.org/W211198884","https://openalex.org/W2117539524","https://openalex.org/W2125629257","https://openalex.org/W2157597705","https://openalex.org/W2406523001","https://openalex.org/W2418691539","https://openalex.org/W24440715","https://openalex.org/W2536297875","https://openalex.org/W2553890187","https://openalex.org/W2554431417","https://openalex.org/W2555875178","https://openalex.org/W2583832915","https://openalex.org/W2588054711","https://openalex.org/W2589306531","https://openalex.org/W2735783528","https://openalex.org/W2782536355","https://openalex.org/W2794550100","https://openalex.org/W2800240267","https://openalex.org/W2897350321","https://openalex.org/W2934616134","https://openalex.org/W3106250896","https://openalex.org/W344203161","https://openalex.org/W4293584584","https://openalex.org/W4302283059"],"related_works":["https://openalex.org/W96612179","https://openalex.org/W632915154","https://openalex.org/W4256492088","https://openalex.org/W4229499248","https://openalex.org/W2987774938","https://openalex.org/W2770234245","https://openalex.org/W2566006169","https://openalex.org/W2378211422","https://openalex.org/W2055733372","https://openalex.org/W1567818861"],"abstract_inverted_index":{"Metallic":[0],"surface":[1,54],"defect":[2,25,28,55,64,94,169],"detection":[3,38,73,95],"is":[4,121,160],"an":[5],"essential":[6],"and":[7,24,68,80,162],"necessary":[8],"process":[9],"to":[10,19,123,137],"control":[11],"the":[12,20,34,37,83,100,125,139,143,149,157],"qualities":[13],"of":[14,36,127],"industrial":[15],"products.":[16],"However,":[17],"due":[18],"limited":[21],"data":[22,69,128,132,141,145],"scale":[23],"categories,":[26,65],"existing":[27],"datasets":[29,154],"are":[30,75,135],"generally":[31],"unavailable":[32],"for":[33,51,82,142,167],"deployment":[35],"model.":[39],"To":[40],"address":[41],"this":[42],"problem,":[43],"we":[44,88],"contribute":[45],"a":[46,91,116],"new":[47],"dataset":[48,59],"called":[49],"GC10-DET":[50,58],"large-scale":[52],"metallic":[53,168],"detection.":[56,170],"The":[57,105],"has":[60],"great":[61],"challenges":[62],"on":[63,99,152],"image":[66],"number,":[67],"scale.":[70],"Besides,":[71],"traditional":[72],"approaches":[74],"poor":[76],"in":[77],"both":[78],"efficiency":[79],"accuracy":[81,165],"complex":[84],"real-world":[85],"environment.":[86],"Thus,":[87],"also":[89],"propose":[90],"novel":[92],"end-to-end":[93],"network":[96],"(EDDN)":[97],"based":[98],"Single":[101],"Shot":[102],"MultiBox":[103],"Detector.":[104],"EDDN":[106],"model":[107],"can":[108,163],"deal":[109],"with":[110,112],"defects":[111],"different":[113],"scales.":[114],"Furthermore,":[115],"hard":[117],"negative":[118],"mining":[119],"method":[120,159],"designed":[122],"alleviate":[124],"problem":[126],"imbalance,":[129],"while":[130],"some":[131],"augmentation":[133],"methods":[134],"adopted":[136],"enrich":[138],"training":[140],"expensive":[144],"collection":[146],"problem.":[147],"Finally,":[148],"extensive":[150],"experiments":[151],"two":[153],"demonstrate":[155],"that":[156],"proposed":[158],"robust":[161],"meet":[164],"requirements":[166]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W3012374719","counts_by_year":[{"year":2024,"cited_by_count":87},{"year":2023,"cited_by_count":79},{"year":2022,"cited_by_count":41},{"year":2021,"cited_by_count":19},{"year":2020,"cited_by_count":3}],"updated_date":"2024-11-03T00:31:59.258814","created_date":"2020-03-23"}
