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{"id":"https://openalex.org/W2033252709","doi":"https://doi.org/10.1117/1.1760757","title":"Optical wear assessment system for grinding tools","display_name":"Optical wear assessment system for grinding tools","publication_year":2004,"publication_date":"2004-07-01","ids":{"openalex":"https://openalex.org/W2033252709","doi":"https://doi.org/10.1117/1.1760757","mag":"2033252709"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1117/1.1760757","pdf_url":null,"source":{"id":"https://openalex.org/S158511090","display_name":"Journal of Electronic Imaging","issn_l":"1017-9909","issn":["1017-9909","1560-229X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047853731","display_name":"Thomas Heger","orcid":null},"institutions":[{"id":"https://openalex.org/I153267046","display_name":"University of Kaiserslautern","ror":"https://ror.org/04zrf7b53","country_code":"DE","type":"education","lineage":["https://openalex.org/I153267046"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Heger","raw_affiliation_strings":["University of Kaiserslautern, P.O. Box 3049, D-67653 Kaiserslautern, Germany"],"affiliations":[{"raw_affiliation_string":"University of Kaiserslautern, P.O. Box 3049, D-67653 Kaiserslautern, Germany","institution_ids":["https://openalex.org/I153267046"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103404787","display_name":"Madhukar Pandit","orcid":null},"institutions":[{"id":"https://openalex.org/I153267046","display_name":"University of Kaiserslautern","ror":"https://ror.org/04zrf7b53","country_code":"DE","type":"education","lineage":["https://openalex.org/I153267046"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Madhukar C. Pandit","raw_affiliation_strings":["University of Kaiserslautern, P.O. Box 3049, D-67653 Kaiserslautern, Germany"],"affiliations":[{"raw_affiliation_string":"University of Kaiserslautern, P.O. Box 3049, D-67653 Kaiserslautern, Germany","institution_ids":["https://openalex.org/I153267046"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.789,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":21,"citation_normalized_percentile":{"value":0.830093,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":86,"max":87},"biblio":{"volume":"13","issue":"3","first_page":"450","last_page":"450"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Characterization of Surface Roughness in Optical Components","score":0.9985,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Characterization of Surface Roughness in Optical Components","score":0.9985,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Fabric Defect Detection in Industrial Applications","score":0.9967,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10188","display_name":"Advanced Monitoring of Machining Operations","score":0.9965,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-defect-detection","display_name":"Surface Defect Detection","score":0.545423},{"id":"https://openalex.org/keywords/fabric-defect-detection","display_name":"Fabric Defect Detection","score":0.522245},{"id":"https://openalex.org/keywords/roughness-measurement","display_name":"Roughness Measurement","score":0.512386},{"id":"https://openalex.org/keywords/surface-characterization","display_name":"Surface Characterization","score":0.511861},{"id":"https://openalex.org/keywords/texture-analysis","display_name":"Texture Analysis","score":0.511154}],"concepts":[{"id":"https://openalex.org/C2777571299","wikidata":"https://www.wikidata.org/wiki/Q3680646","display_name":"Grinding","level":2,"score":0.8927908},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.5859952},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.5115636},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49908018},{"id":"https://openalex.org/C69744172","wikidata":"https://www.wikidata.org/wiki/Q860822","display_name":"Image fusion","level":3,"score":0.4899072},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47166812},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.39679405},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.37147057},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3514515},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.32986504},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.222098},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15475807},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.14358431}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1117/1.1760757","pdf_url":null,"source":{"id":"https://openalex.org/S158511090","display_name":"Journal of Electronic Imaging","issn_l":"1017-9909","issn":["1017-9909","1560-229X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":9,"referenced_works":["https://openalex.org/W1548811000","https://openalex.org/W1948236804","https://openalex.org/W2067530554","https://openalex.org/W2079698779","https://openalex.org/W2094507611","https://openalex.org/W2104095591","https://openalex.org/W2141592093","https://openalex.org/W2145803225","https://openalex.org/W2148107745"],"related_works":["https://openalex.org/W2885148902","https://openalex.org/W2368671946","https://openalex.org/W2151432121","https://openalex.org/W2116037602","https://openalex.org/W2077021924","https://openalex.org/W2053540217","https://openalex.org/W2019040739","https://openalex.org/W2007377145","https://openalex.org/W1996520261","https://openalex.org/W1502763594"],"abstract_inverted_index":{"The":[0],"inspection":[1,75],"and":[2,21,76,86,100,124,129],"monitoring":[3],"of":[4,7,16,26,45,57,64,89,109,135,138],"the":[5,14,17,22,27,39,43,46,55,58,62,84,87,93,119,132,136,139],"wear":[6,90],"grinding":[8,18,33,40,47,144],"tools":[9],"is":[10,50,112,115],"essential":[11],"to":[12,126],"ensure":[13],"quality":[15,56],"tool":[19,34,48,145],"surface":[20,35,49,85],"finished":[23],"product.":[24],"Most":[25],"current":[28],"methods":[29],"for":[30,72,141],"examining":[31],"a":[32,106,142,151],"rely":[36],"on":[37,131],"dismounting":[38],"tool.":[41],"Often,":[42],"state":[44],"checked":[51],"indirectly":[52],"by":[53],"evaluating":[54],"workpiece.":[59],"We":[60],"describe":[61],"application":[63,137],"image":[65,101,104],"processing,":[66],"which":[67],"offers":[68],"an":[69,103],"effective":[70],"means":[71],"in":[73,150],"situ":[74],"monitoring.":[77],"It":[78],"yields":[79],"more":[80],"detailed":[81],"information":[82,111],"about":[83],"kind":[88],"observed":[91],"than":[92],"common":[94],"methods.":[95],"By":[96],"using":[97,118],"multidirectional":[98],"illumination":[99],"fusion,":[102],"with":[105,146],"high":[107],"degree":[108],"relevant":[110],"generated":[113],"that":[114],"then":[116],"segmented":[117],"wavelet":[120],"transform":[121],"(multiscale":[122],"analysis)":[123],"classified":[125],"distinguish":[127],"grains":[128,148],"cavities":[130],"surface.":[133],"Results":[134],"algorithms":[140],"high-performance":[143],"CBN":[147],"embedded":[149],"resin":[152],"base":[153],"are":[154],"presented.":[155]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2033252709","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":3}],"updated_date":"2024-12-04T03:40:56.701260","created_date":"2016-06-24"}
