iBet uBet web content aggregator. Adding the entire web to your favor.
iBet uBet web content aggregator. Adding the entire web to your favor.



Link to original content: https://api.openalex.org/works/doi:10.1109/VLSID.2018.81
{"id":"https://openalex.org/W2794513934","doi":"https://doi.org/10.1109/vlsid.2018.81","title":"CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems","display_name":"CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2794513934","doi":"https://doi.org/10.1109/vlsid.2018.81","mag":"2794513934"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsid.2018.81","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051064456","display_name":"Siva Satyendra Sahoo","orcid":"https://orcid.org/0000-0002-2243-5350"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Siva Satyendra Sahoo","raw_affiliation_strings":["Department of ECE, National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"Department of ECE, National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070594442","display_name":"Bharadwaj Veeravalli","orcid":"https://orcid.org/0000-0001-9000-1813"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Bharadwaj Veeravalli","raw_affiliation_strings":["Department of ECE, National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"Department of ECE, National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100755285","display_name":"Akash Kumar","orcid":"https://orcid.org/0000-0001-7125-1737"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"TU Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Akash Kumar","raw_affiliation_strings":["Center for Advancing Electronics Dresden, Technische Universitat Dresden, Dresden, Germany"],"affiliations":[{"raw_affiliation_string":"Center for Advancing Electronics Dresden, Technische Universitat Dresden, Dresden, Germany","institution_ids":["https://openalex.org/I78650965"]}]}],"institution_assertions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.89,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.860157,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":83,"max":84},"biblio":{"volume":null,"issue":null,"first_page":"307","last_page":"312"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9982,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.42020318}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.63038456},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.58405876},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5679305},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.55912876},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.53666794},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.52918},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.52481663},{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.422685},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.42020318},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.40806505},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37527263},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.33895546},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.32802725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2003665},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07811776},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsid.2018.81","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":12,"referenced_works":["https://openalex.org/W1963480044","https://openalex.org/W2021146938","https://openalex.org/W2083004950","https://openalex.org/W2125169487","https://openalex.org/W2165027640","https://openalex.org/W2169213530","https://openalex.org/W2296204683","https://openalex.org/W2337485678","https://openalex.org/W2542725517","https://openalex.org/W3144162164","https://openalex.org/W4250195757","https://openalex.org/W4252024481"],"related_works":["https://openalex.org/W4289293028","https://openalex.org/W2950848781","https://openalex.org/W2901915715","https://openalex.org/W2383699822","https://openalex.org/W2278517150","https://openalex.org/W2183032281","https://openalex.org/W2160179184","https://openalex.org/W2151327182","https://openalex.org/W2051500795","https://openalex.org/W1986800855"],"abstract_inverted_index":{"Continued":[0],"transistor":[1],"scaling":[2],"and":[3,48,50,55,65,119,132],"increasing":[4],"power":[5],"density":[6],"have":[7],"led":[8],"to":[9,39],"considerable":[10],"increase":[11],"in":[12,15],"fault":[13,29,42],"rates":[14],"silicon":[16],"nanotechnology-based":[17],"real-time":[18],"systems.":[19],"Instead":[20],"of":[21,57,76,100,116,136],"fixing":[22],"everything":[23],"at":[24,68,142],"the":[25,63,66,98],"hardware":[26],"layer,":[27],"cross-layer":[28,83],"tolerance":[30],"techniques":[31],"present":[32],"a":[33,93,109,124],"more":[34],"cost-efficient":[35],"methodology":[36,112],"for":[37,81,96,113],"adapting":[38],"such":[40],"increased":[41],"rates.":[43],"The":[44],"effectiveness":[45],"(Coverage,":[46],"Fault-Masking,":[47],"Recovery)":[49],"overheads":[51],"(Execution":[52],"time,":[53],"Energy":[54],"Cost)":[56],"each":[58],"fault-tolerance":[59,102],"technique":[60],"vary":[61],"with":[62],"layer":[64],"frequency":[67],"which":[69],"it":[70],"is":[71,79],"implemented.":[72],"Therefore,":[73],"appropriate":[74],"modeling":[75,115,135],"fault-mitigation":[77,117,130,141],"methods":[78,118,131],"necessary":[80],"efficient":[82],"design":[84],"space":[85],"exploration":[86],"(DSE).":[87],"To":[88],"this":[89],"end,":[90],"we":[91,126],"propose":[92,108],"first-order":[94],"framework":[95],"analyzing":[97],"effects":[99],"implementing":[101],"across":[103],"multiple":[104],"layers.":[105,144],"We":[106],"also":[107],"Markov-chain":[110],"based":[111],"analytical":[114],"their":[120],"interlayer":[121],"interaction.":[122],"As":[123],"case-study,":[125],"model":[127],"some":[128],"generic":[129],"provide":[133],"detailed":[134],"typical":[137],"application":[138],"execution":[139],"involving":[140],"different":[143]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2794513934","counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2024-12-13T16:34:04.558971","created_date":"2018-04-06"}