iBet uBet
web content aggregator. Adding the entire web to your favor.
Link to original content:
https://api.openalex.org/works/doi:10.1109/VLSID.2018.72
{"id":"https://openalex.org/W2794548838","doi":"https://doi.org/10.1109/vlsid.2018.72","title":"Impact of Device Aging on Early Mode Failures in Pulsed Latches","display_name":"Impact of Device Aging on Early Mode Failures in Pulsed Latches","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2794548838","doi":"https://doi.org/10.1109/vlsid.2018.72","mag":"2794548838"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsid.2018.72","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000342593","display_name":"Ankur Shukla","orcid":"https://orcid.org/0000-0002-6737-2031"},"institutions":[{"id":"https://openalex.org/I4210129961","display_name":"IBM (India)","ror":"https://ror.org/034ahpr11","country_code":"IN","type":"company","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210129961"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ankur Shukla","raw_affiliation_strings":["IBM Systems, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"IBM Systems, Bangalore, India","institution_ids":["https://openalex.org/I4210129961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103068738","display_name":"Rahul Rao","orcid":"https://orcid.org/0000-0002-7784-7029"},"institutions":[{"id":"https://openalex.org/I4210129961","display_name":"IBM (India)","ror":"https://ror.org/034ahpr11","country_code":"IN","type":"company","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210129961"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rahul M. Rao","raw_affiliation_strings":["IBM Systems, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"IBM Systems, Bangalore, India","institution_ids":["https://openalex.org/I4210129961"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103347008","display_name":"J.D. Warnock","orcid":null},"institutions":[{"id":"https://openalex.org/I4210129961","display_name":"IBM (India)","ror":"https://ror.org/034ahpr11","country_code":"IN","type":"company","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210129961"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"James D. Warnock","raw_affiliation_strings":["IBM Systems, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"IBM Systems, Bangalore, India","institution_ids":["https://openalex.org/I4210129961"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":62},"biblio":{"volume":null,"issue":null,"first_page":"256","last_page":"260"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.47446093},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation","score":0.4610393},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.41636947}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.62020767},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.47446093},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.47097468},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4610393},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45640695},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.41636947},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40483072},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39936045},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38361517},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.37615708},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24639893},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsid.2018.72","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.74}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":12,"referenced_works":["https://openalex.org/W1982822282","https://openalex.org/W1987145716","https://openalex.org/W2048459293","https://openalex.org/W2057757361","https://openalex.org/W2098252636","https://openalex.org/W2102785080","https://openalex.org/W2107944009","https://openalex.org/W2132729131","https://openalex.org/W2137706187","https://openalex.org/W2138577377","https://openalex.org/W2164178706","https://openalex.org/W3145466197"],"related_works":["https://openalex.org/W3125011624","https://openalex.org/W3091955004","https://openalex.org/W2979236518","https://openalex.org/W2952760143","https://openalex.org/W2370917603","https://openalex.org/W2358318464","https://openalex.org/W2347897961","https://openalex.org/W2340870721","https://openalex.org/W2017776670","https://openalex.org/W1508631387"],"abstract_inverted_index":{"Pulsed":[0],"latches":[1,50],"that":[2,26,57],"are":[3,10],"widely":[4],"used":[5],"in":[6,48,64],"high":[7],"performance":[8,17],"circuits":[9,18,68],"susceptible":[11],"to":[12,31,59,74],"early":[13],"mode":[14],"failures.":[15],"High":[16],"also":[19],"experience":[20],"higher":[21],"voltage":[22],"and":[23,36,71],"temperature":[24],"conditions":[25],"exacerbates":[27],"device":[28],"degradation":[29],"due":[30],"mechanisms":[32],"such":[33],"as":[34],"BTI":[35],"HCI.":[37],"In":[38],"this":[39],"paper,":[40],"the":[41,65,72],"impact":[42],"of":[43,54],"aging":[44],"on":[45],"hold":[46,77],"slack":[47],"pulsed":[49],"is":[51,69,82],"presented.":[52],"Analysis":[53],"clock":[55],"gating":[56],"leads":[58],"AC":[60],"or":[61],"DC":[62],"stress":[63],"pulse":[66],"generation":[67],"illustrated,":[70],"need":[73],"provide":[75],"additional":[76],"margin":[78],"for":[79],"these":[80],"effects":[81],"demonstrated.":[83]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2794548838","counts_by_year":[],"updated_date":"2024-12-09T05:50:50.510714","created_date":"2018-04-06"}
