{"id":"https://openalex.org/W2094646617","doi":"https://doi.org/10.1109/t-c.1974.223807","title":"Procedures for Eliminating Static and Dynamic Hazards in Test Generation","display_name":"Procedures for Eliminating Static and Dynamic Hazards in Test Generation","publication_year":1974,"publication_date":"1974-10-01","ids":{"openalex":"https://openalex.org/W2094646617","doi":"https://doi.org/10.1109/t-c.1974.223807","mag":"2094646617"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/t-c.1974.223807","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111192060","display_name":"M.A. Breuer","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.A. Breuer","raw_affiliation_strings":["Department of Electrical Engineering, University of Southern California, Los Angeles, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Southern California, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025098216","display_name":"Ronald Harrison","orcid":null},"institutions":[{"id":"https://openalex.org/I200576644","display_name":"HRL Laboratories (United States)","ror":"https://ror.org/05p7te762","country_code":"US","type":"company","lineage":["https://openalex.org/I200576644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.L. Harrison","raw_affiliation_strings":["Ground Systems Group, Hughes Aircraft Company, Fullerton, CA, USA"],"affiliations":[{"raw_affiliation_string":"Ground Systems Group, Hughes Aircraft Company, Fullerton, CA, USA","institution_ids":["https://openalex.org/I200576644"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.193,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":33,"citation_normalized_percentile":{"value":0.938017,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":92,"max":93},"biblio":{"volume":"C-23","issue":"10","first_page":"1069","last_page":"1078"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"Very Large Scale Integration Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"Very Large Scale Integration Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Automated Software Testing Techniques","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Fault Diagnosis in Complex Systems","score":0.9982,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dynamic-test-generation","display_name":"Dynamic Test Generation","score":0.563689},{"id":"https://openalex.org/keywords/dynamic-testing","display_name":"Dynamic testing","score":0.5401721},{"id":"https://openalex.org/keywords/static-testing","display_name":"Static testing","score":0.53520304},{"id":"https://openalex.org/keywords/delay-fault-testing","display_name":"Delay Fault Testing","score":0.513258},{"id":"https://openalex.org/keywords/automated-testing","display_name":"Automated Testing","score":0.511051},{"id":"https://openalex.org/keywords/testability-analysis","display_name":"Testability Analysis","score":0.500825}],"concepts":[{"id":"https://openalex.org/C49261128","wikidata":"https://www.wikidata.org/wiki/Q1132455","display_name":"Hazard","level":2,"score":0.69001305},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.67556876},{"id":"https://openalex.org/C198824145","wikidata":"https://www.wikidata.org/wiki/Q442770","display_name":"Dynamic testing","level":2,"score":0.5401721},{"id":"https://openalex.org/C207190284","wikidata":"https://www.wikidata.org/wiki/Q1329550","display_name":"Static testing","level":2,"score":0.53520304},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5101998},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5085956},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.45878083},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.44081008},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3640014},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1594679},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/t-c.1974.223807","pdf_url":null,"source":{"id":"https://openalex.org/S157670870","display_name":"IEEE Transactions on Computers","issn_l":"0018-9340","issn":["0018-9340","1557-9956","2326-3814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[],"grants":[],"datasets":[],"versions":[],"referenced_works_count":10,"referenced_works":["https://openalex.org/W1993225874","https://openalex.org/W2020573802","https://openalex.org/W2033724727","https://openalex.org/W2072647403","https://openalex.org/W2079866295","https://openalex.org/W2087047691","https://openalex.org/W2111994103","https://openalex.org/W2120688461","https://openalex.org/W2183447937","https://openalex.org/W2187622185"],"related_works":["https://openalex.org/W815453559","https://openalex.org/W647320872","https://openalex.org/W2588873810","https://openalex.org/W2388211127","https://openalex.org/W2388072073","https://openalex.org/W2382789356","https://openalex.org/W2355902503","https://openalex.org/W2130619111","https://openalex.org/W2117523160","https://openalex.org/W2082184755"],"abstract_inverted_index":{"One":[0],"problem":[1],"associated":[2],"with":[3,106],"test":[4,64,141],"generation":[5,65],"algorithms":[6,66],"for":[7,35,92],"sequential":[8],"circuits":[9],"is":[10,87],"that":[11,68,144],"they":[12],"often":[13],"produce":[14,74],"tests":[15,75],"which,":[16],"when":[17,108],"applied":[18],"to":[19,61,81,84,120],"the":[20,32,69],"circuit":[21],"under":[22],"test,":[23],"create":[24],"static":[25,36,95],"and/or":[26],"dynamic":[27,40,97],"hazards":[28,109],"which":[29,57,76,133],"may":[30],"invalidate":[31],"test.":[33],"Usually,":[34],"hazards,":[37,41],"but":[38],"not":[39,73],"these":[42],"situations":[43],"can":[44,58],"be":[45,59,78],"predicted":[46],"using":[47],"a":[48,88,113,121,125],"logic":[49],"simulator.":[50],"In":[51],"this":[52,85,103],"paper":[53],"we":[54],"present":[55],"procedures":[56],"added":[60],"path":[62],"sensitization":[63],"so":[67,143],"resulting":[70],"procedure":[71],"will":[72,77],"invalidated":[79],"due":[80],"hazards.":[82,98],"Incidental":[83],"work":[86,104],"new":[89],"simulation":[90],"technique":[91],"handling":[93],"both":[94],"and":[96,138],"The":[99],"principal":[100],"concepts":[101],"behind":[102],"deal":[105],"detecting":[107,127],"are":[110,149],"created":[111],"in":[112],"circuit;":[114,126],"propagating":[115],"hazard":[116,135,146],"status":[117],"information":[118],"related":[119],"signal":[122],"line":[123],"through":[124],"those":[128],"conditions":[129,148],"at":[130],"flip-flop":[131],"inputs":[132,142],"necessitate":[134],"free":[136,147],"conditions;":[137],"finally,":[139],"selecting":[140],"all":[145],"satisfied.":[150]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2094646617","counts_by_year":[],"updated_date":"2024-10-14T18:03:11.054905","created_date":"2016-06-24"}
