{"id":"https://openalex.org/W2106054302","doi":"https://doi.org/10.1109/iscas.2007.378279","title":"Fundamental Bounds on Power Reduction during Data-Retention in Standby SRAM","display_name":"Fundamental Bounds on Power Reduction during Data-Retention in Standby SRAM","publication_year":2007,"publication_date":"2007-05-01","ids":{"openalex":"https://openalex.org/W2106054302","doi":"https://doi.org/10.1109/iscas.2007.378279","mag":"2106054302"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2007.378279","pdf_url":null,"source":{"id":"https://openalex.org/S4363604427","display_name":"1993 IEEE International Symposium on Circuits and Systems","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051203367","display_name":"Ajay Kumar","orcid":"https://orcid.org/0000-0002-3761-2436"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Kumar","raw_affiliation_strings":["EECS, University of California, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"EECS, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102738125","display_name":"Hao Qin","orcid":"https://orcid.org/0000-0002-4650-3266"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Qin","raw_affiliation_strings":["EECS, University of California, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"EECS, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036913803","display_name":"Prakash Ishwar","orcid":"https://orcid.org/0000-0002-2621-1549"},"institutions":[{"id":"https://openalex.org/I111088046","display_name":"Boston University","ror":"https://ror.org/05qwgg493","country_code":"US","type":"education","lineage":["https://openalex.org/I111088046"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Ishwar","raw_affiliation_strings":["ECE, Boston University, Boston, MA, USA"],"affiliations":[{"raw_affiliation_string":"ECE, Boston University, Boston, MA, USA","institution_ids":["https://openalex.org/I111088046"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088933304","display_name":"Jan M. Rabaey","orcid":"https://orcid.org/0000-0001-6290-4855"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Rabaey","raw_affiliation_strings":["EECS, University of California, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"EECS, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030620564","display_name":"Kannan Ramchandran","orcid":"https://orcid.org/0000-0002-4567-328X"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Ramchandran","raw_affiliation_strings":["EECS, University of California, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"EECS, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.936,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":14,"citation_normalized_percentile":{"value":0.873631,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":85,"max":86},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-Power VLSI Circuit Design and Optimization","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-Power VLSI Circuit Design and Optimization","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Fault Tolerance in Electronic Systems","score":0.9998,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Atomic Layer Deposition Technology","score":0.9992,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/standby-power","display_name":"Standby power","score":0.5791331},{"id":"https://openalex.org/keywords/leakage-reduction","display_name":"Leakage Reduction","score":0.558327},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.45929733},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.43933693}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7633935},{"id":"https://openalex.org/C7140552","wikidata":"https://www.wikidata.org/wiki/Q1366402","display_name":"Standby power","level":3,"score":0.5791331},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5036456},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5026672},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.50219584},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4892628},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.45929733},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4504283},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.43933693},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.41839266},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.40792477},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3762446},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37491566},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3238824},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27270573},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2498737},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.24890095},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24152258},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12575123},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11557782},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2007.378279","pdf_url":null,"source":{"id":"https://openalex.org/S4363604427","display_name":"1993 IEEE International Symposium on Circuits and Systems","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.71}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":9,"referenced_works":["https://openalex.org/W1986389751","https://openalex.org/W2020609748","https://openalex.org/W2040075573","https://openalex.org/W2099111195","https://openalex.org/W2109458212","https://openalex.org/W2143137068","https://openalex.org/W2159103279","https://openalex.org/W2543171663","https://openalex.org/W2546351422"],"related_works":["https://openalex.org/W4377020067","https://openalex.org/W4295791092","https://openalex.org/W2894040387","https://openalex.org/W2773448237","https://openalex.org/W2765125965","https://openalex.org/W2539500217","https://openalex.org/W2188598220","https://openalex.org/W2162271340","https://openalex.org/W2023834321","https://openalex.org/W1785301911"],"abstract_inverted_index":{"The":[0,116,183,207],"authors":[1,117,150,184,208],"study":[2,186],"leakage-power":[3],"reduction":[4,87,109,124,155,170,189,229],"in":[5,77,113,125,144],"standby":[6,62],"random":[7],"access":[8],"memories":[9],"(SRAMs)":[10],"during":[11],"data-retention.":[12],"An":[13],"SRAM":[14,203],"cell":[15],"requires":[16],"a":[17,39,42,60,163,178,191,210,226],"minimum":[18],"critical":[19],"supply":[20,63],"voltage":[21,67,86],"(DRV)":[22],"above":[23],"which":[24],"it":[25],"preserves":[26],"the":[27,33,71,82,90,114,122,128,145,149,160,172,187,194,217,221],"stored-bit":[28],"reliably.":[29],"Due":[30],"to":[31,47,158],"process-variations,":[32],"intra-chip":[34],"DRV":[35,73],"exhibits":[36],"variation":[37],"with":[38,156,225],"distribution":[40],"having":[41],"diminishing":[43],"tail.":[44],"In":[45,80],"order":[46],"minimize":[48],"leakage":[49],"power":[50,108,123,154,169,188,228],"while":[51,167,232],"preserving":[52],"data":[53],"reliably,":[54],"existing":[55],"low-power":[56,212],"design":[57],"methods":[58],"use":[59],"worst-case":[61,66,161,173],"voltage.":[64],"This":[65],"is":[68,162,174],"larger":[69],"than":[70],"highest":[72],"among":[74],"all":[75],"cells":[76],"an":[78,94,140],"SRAM.":[79,115],"contrast,":[81],"approach":[83],"uses":[84],"aggressive":[85],"and":[88,110,135],"counters":[89],"ensuing":[91],"unreliability":[92],"by":[93,176],"error-control":[95],"code":[96,219],"based":[97,215],"memory":[98,213],"architecture.":[99],"Using":[100],"this":[101],"approach,":[102],"we":[103],"explore":[104],"fundamental":[105,119,164],"trade-offs":[106],"between":[107],"redundancy":[111],"present":[112],"establish":[118],"bounds":[120],"on":[121,216],"terms":[126],"of":[127,193,230],"DRV-distribution":[129,143],"using":[130,177,202],"techniques":[131],"from":[132],"information":[133],"theory":[134],"algebraic":[136,180],"coding":[137,181,235],"theory.":[138],"For":[139],"experimental":[141],"test-chip":[142,223],"90nm":[146],"CMOS":[147],"technology,":[148],"show":[151],"that":[152],"49%":[153],"respect":[157],"(w.r.t.)":[159],"lower":[165],"bound":[166],"40%":[168],"w.r.t.":[171],"achievable":[175],"practical":[179],"scheme.":[182],"also":[185],"as":[190],"function":[192],"block-length":[195],"for":[196,220,234],"low-latency":[197],"codes":[198],"since":[199],"most":[200],"applications":[201],"are":[204],"latency":[205],"constrained.":[206],"propose":[209],"reliable":[211],"architecture":[214],"Hamming":[218],"next":[222],"implementation":[224],"predicted":[227],"33%":[231],"accounting":[233],"overheads":[236]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W2106054302","counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2024-11-24T22:16:34.938264","created_date":"2016-06-24"}
