{"id":"https://openalex.org/W3146604028","doi":"https://doi.org/10.1109/date.2009.5090685","title":"TRAM: A tool for Temperature and Reliability Aware Memory Design","display_name":"TRAM: A tool for Temperature and Reliability Aware Memory Design","publication_year":2009,"publication_date":"2009-04-01","ids":{"openalex":"https://openalex.org/W3146604028","doi":"https://doi.org/10.1109/date.2009.5090685","mag":"3146604028"},"language":"en","primary_location":{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2009.5090685","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},"type":"article","type_crossref":"proceedings-article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://newport.eecs.uci.edu/~aeltawil/Publications/Conferences/C32.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077252302","display_name":"Amin Khajeh","orcid":"https://orcid.org/0000-0003-0770-0109"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Khajeh","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040193683","display_name":"Aseem Gupta","orcid":null},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Gupta","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007817952","display_name":"Nikil Dutt","orcid":"https://orcid.org/0000-0002-3060-8119"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Dutt","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008034875","display_name":"Fadi Kurdahi","orcid":"https://orcid.org/0000-0002-6982-365X"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Kurdahi","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013660772","display_name":"Ahmed M. Eltawil","orcid":"https://orcid.org/0000-0003-1849-083X"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Eltawil","raw_affiliation_strings":["University of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077269784","display_name":"K.S. Khouri","orcid":null},"institutions":[],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Khouri","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011349515","display_name":"Magdy S. Abadir","orcid":"https://orcid.org/0000-0003-4046-2472"},"institutions":[],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Abadir","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.394,"has_fulltext":true,"fulltext_origin":"ngrams","cited_by_count":2,"citation_normalized_percentile":{"value":0.441742,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":71,"max":75},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-Power VLSI Circuit Design and Optimization","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-Power VLSI Circuit Design and Optimization","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Atomic Layer Deposition Technology","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Nanoelectronics and Transistors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/statistical-timing-analysis","display_name":"Statistical Timing Analysis","score":0.530085},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process Variation","score":0.521904},{"id":"https://openalex.org/keywords/leakage-reduction","display_name":"Leakage Reduction","score":0.508209},{"id":"https://openalex.org/keywords/energy-efficiency","display_name":"Energy Efficiency","score":0.504193},{"id":"https://openalex.org/keywords/cmos-scaling","display_name":"CMOS Scaling","score":0.503847}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8156363},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.63309175},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5974095},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5611084},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.55840456},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5232778},{"id":"https://openalex.org/C114834414","wikidata":"https://www.wikidata.org/wiki/Q15477170","display_name":"Thermal management of electronic devices and systems","level":2,"score":0.49379382},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.42366433},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28936976},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2000229},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16917089},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16525158},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.104937285},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.085421145},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2009.5090685","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false},{"is_oa":true,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.619.3544","pdf_url":"http://newport.eecs.uci.edu/~aeltawil/Publications/Conferences/C32.pdf","source":{"id":"https://openalex.org/S4306400349","display_name":"CiteSeer X (The Pennsylvania State University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I130769515","host_organization_name":"Pennsylvania State University","host_organization_lineage":["https://openalex.org/I130769515"],"host_organization_lineage_names":["Pennsylvania State University"],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false}],"best_oa_location":{"is_oa":true,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.619.3544","pdf_url":"http://newport.eecs.uci.edu/~aeltawil/Publications/Conferences/C32.pdf","source":{"id":"https://openalex.org/S4306400349","display_name":"CiteSeer X (The Pennsylvania State University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I130769515","host_organization_name":"Pennsylvania State University","host_organization_lineage":["https://openalex.org/I130769515"],"host_organization_lineage_names":["Pennsylvania State University"],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.62}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":13,"referenced_works":["https://openalex.org/W1607915263","https://openalex.org/W1661368752","https://openalex.org/W1990935421","https://openalex.org/W2122087341","https://openalex.org/W2122130138","https://openalex.org/W2130342263","https://openalex.org/W2132621842","https://openalex.org/W2146018705","https://openalex.org/W2159974434","https://openalex.org/W2168101540","https://openalex.org/W2168559772","https://openalex.org/W2589035738","https://openalex.org/W4232226099"],"related_works":["https://openalex.org/W4322734194","https://openalex.org/W4233757488","https://openalex.org/W4233600955","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2110842462","https://openalex.org/W2033512842","https://openalex.org/W1607054433"],"abstract_inverted_index":{"Memories":[0],"are":[1],"increasingly":[2],"dominating":[3],"Systems":[4],"on":[5,44,76,146],"Chip":[6],"(SoC)":[7],"designs":[8],"and":[9,22,42,47,54,74,105],"thus":[10],"contribute":[11],"a":[12,29,52,79],"large":[13],"percentage":[14],"of":[15,35,68,91,93,103,110],"the":[16,33,66,113,132],"total":[17,133],"system's":[18],"power":[19,72,134],"dissipation,":[20,73],"area":[21],"reliability.":[23],"In":[24],"this":[25],"paper,":[26],"we":[27],"present":[28],"tool":[30],"which":[31,61],"captures":[32],"effects":[34,67],"supply":[36,70],"voltage":[37],"V":[38,123],"dd":[41,126],"temperature":[43,75],"memory":[45],"performance":[46],"their":[48],"interrelationships.":[49],"We":[50,117],"propose":[51],"Temperature-":[53],"Reliability-":[55],"Aware":[56],"Memory":[57],"Design":[58],"(TRAM)":[59],"approach":[60],"allows":[62],"designers":[63],"to":[64,107,138],"examine":[65],"frequency,":[69],"voltage,":[71],"reliability":[77],"in":[78],"mutually":[80],"interrelated":[81],"manner.":[82],"Our":[83],"experimental":[84],"results":[85],"indicate":[86],"that":[87,120],"thermal":[88,121],"unaware":[89],"estimation":[90],"probability":[92],"error":[94],"can":[95,130],"be":[96],"off":[97],"by":[98,136],"at":[99],"least":[100],"two":[101],"orders":[102,109],"magnitude":[104,111],"up":[106,137],"five":[108],"from":[112],"realistic,":[114],"temperature-aware":[115],"cases.":[116],"also":[118],"observed":[119],"aware":[122],"selection":[127],"using":[128],"TRAM":[129],"reduce":[131],"dissipation":[135],"2.5times":[139],"while":[140],"attaining":[141],"an":[142],"identical":[143],"predefined":[144],"limit":[145],"errors.":[147]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W3146604028","counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2024-11-21T05:56:16.622641","created_date":"2021-04-13"}
