{"id":"https://openalex.org/W4400810264","doi":"https://doi.org/10.1109/access.2024.3431268","title":"Research on Series Arc Fault Detection Method Based on the Combination of Load Recognition and MLP-SVM","display_name":"Research on Series Arc Fault Detection Method Based on the Combination of Load Recognition and MLP-SVM","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4400810264","doi":"https://doi.org/10.1109/access.2024.3431268"},"language":"en","primary_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3431268","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3431268","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101500815","display_name":"Nengqi Wu","orcid":"https://orcid.org/0009-0005-7754-8546"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nengqi Wu","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111262362","display_name":"Mingyi Peng","orcid":null},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingyi Peng","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105109747","display_name":"Jiaju Wang","orcid":"https://orcid.org/0009-0007-7236-9455"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaju Wang","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100322864","display_name":"Li Wang","orcid":"https://orcid.org/0000-0003-0272-2974"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Honglei Wang","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103048035","display_name":"Qiwei Lu","orcid":"https://orcid.org/0000-0002-1685-2019"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiwei Lu","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056097724","display_name":"Mingzhe Wu","orcid":"https://orcid.org/0000-0002-9083-066X"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingzhe Wu","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105109752","display_name":"Hanning Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hanning Zhang","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5105109750","display_name":"Fanfan Ni","orcid":null},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fanfan Ni","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, China University of Mining and Technology, Beijing, China","institution_ids":["https://openalex.org/I25757504"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850,"provenance":"doaj"},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850,"provenance":"doaj"},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":0,"max":85},"biblio":{"volume":"12","issue":null,"first_page":"100186","last_page":"100199"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Detection and Localization of Arc Faults in Electrical Systems","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Detection and Localization of Arc Faults in Electrical Systems","score":0.9996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Failure Analysis of Integrated Circuits","score":0.9917,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10809","display_name":"Enhancing Workplace Safety Culture and Practices","score":0.9697,"subfield":{"id":"https://openalex.org/subfields/3614","display_name":"Radiological and Ultrasound Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.5707414},{"id":"https://openalex.org/keywords/detection","display_name":"Detection","score":0.562807},{"id":"https://openalex.org/keywords/laser-voltage-probing","display_name":"Laser Voltage Probing","score":0.538679},{"id":"https://openalex.org/keywords/multilayer-perceptron","display_name":"Multilayer perceptron","score":0.5263872},{"id":"https://openalex.org/keywords/fault-localization","display_name":"Fault Localization","score":0.514832},{"id":"https://openalex.org/keywords/series-faults","display_name":"Series Faults","score":0.501123}],"concepts":[{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.7318431},{"id":"https://openalex.org/C158693339","wikidata":"https://www.wikidata.org/wiki/Q190524","display_name":"Eigenvalues and eigenvectors","level":2,"score":0.6899241},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.63640696},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.63327074},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.58936906},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.5707414},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5480686},{"id":"https://openalex.org/C179717631","wikidata":"https://www.wikidata.org/wiki/Q2991667","display_name":"Multilayer perceptron","level":3,"score":0.5263872},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.46631014},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45703638},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44558796},{"id":"https://openalex.org/C83415579","wikidata":"https://www.wikidata.org/wiki/Q161973","display_name":"Arc (geometry)","level":2,"score":0.4368996},{"id":"https://openalex.org/C151406439","wikidata":"https://www.wikidata.org/wiki/Q186588","display_name":"Time series","level":2,"score":0.42281926},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.23507944},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.21300015},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20530477},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3431268","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true}],"best_oa_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3431268","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.55}],"grants":[{"funder":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China","award_id":"52074305"}],"datasets":[],"versions":[],"referenced_works_count":26,"referenced_works":["https://openalex.org/W1977209575","https://openalex.org/W2012511350","https://openalex.org/W2088708398","https://openalex.org/W2322357398","https://openalex.org/W2560233485","https://openalex.org/W2572569838","https://openalex.org/W2585885232","https://openalex.org/W2771084599","https://openalex.org/W2909088255","https://openalex.org/W2921108624","https://openalex.org/W2996455563","https://openalex.org/W3006920857","https://openalex.org/W3080376411","https://openalex.org/W3131763504","https://openalex.org/W3169473016","https://openalex.org/W4212819272","https://openalex.org/W4237642300","https://openalex.org/W4283829502","https://openalex.org/W4286377611","https://openalex.org/W4294295929","https://openalex.org/W4321382222","https://openalex.org/W4365141213","https://openalex.org/W4377102726","https://openalex.org/W4385143397","https://openalex.org/W4387637570","https://openalex.org/W4391503408"],"related_works":["https://openalex.org/W3135897568","https://openalex.org/W3045564025","https://openalex.org/W3036572561","https://openalex.org/W2810064750","https://openalex.org/W2544839741","https://openalex.org/W2515218844","https://openalex.org/W2062626603","https://openalex.org/W2033676320","https://openalex.org/W1965970232","https://openalex.org/W1885735754"],"abstract_inverted_index":{"In":[0],"this":[1,126],"study,":[2],"a":[3,75,81],"series":[4,29,177],"arc":[5,30,38,64,178],"fault":[6,31,39,65,179],"detection":[7,32],"method":[8,21,165],"combining":[9],"load":[10,70,127],"recognition":[11,71],"and":[12,33,53,66,84,135],"multilayer":[13],"perceptron-support":[14],"vector":[15],"machine":[16],"(MLP-SVM)":[17],"is":[18,72,95],"proposed.":[19],"The":[20,92,149,160],"addresses":[22],"the":[23,34,45,48,59,100,103,111,116,121,139,144,164],"issue":[24],"of":[25,36,47,113,118,157,169],"interfering":[26,170],"loads":[27,55],"on":[28],"lack":[35],"significant":[37],"features":[40],"in":[41,58,102,110,115,173,176],"some":[42],"loads.":[43],"Initially,":[44],"eigenvalues":[46,112],"line":[49,122],"currents":[50],"for":[51,89,147],"single":[52],"mixed":[54],"are":[56,87],"extracted":[57],"time":[60],"domain,":[61],"both":[62],"during":[63],"normal":[67],"conditions.":[68],"Subsequently,":[69],"performed":[73],"using":[74],"complex":[76],"matrix":[77,83,86,94,105],"calculation":[78],"method.":[79],"Then,":[80],"feature":[82,104],"history":[85,93],"created":[88],"each":[90,114],"load.":[91],"then":[96,141],"used":[97],"to":[98,106,137],"compare":[99],"data":[101],"detect":[107],"any":[108,119],"abnormalities":[109],"presence":[117],"irregularity,":[120],"current":[123],"flowing":[124],"through":[125],"will":[128,152],"be":[129,153],"consistently":[130],"gathered":[131],"throughout":[132],"several":[133],"cycles,":[134],"processed":[136],"obtain":[138],"eigenvalues,":[140],"fed":[142],"into":[143],"MLP-SVM":[145],"model":[146,158],"training.":[148],"classification":[150],"outcomes":[151],"achieved":[154],"by":[155],"means":[156],"train.":[159],"results":[161],"demonstrate":[162],"that":[163],"effectively":[166],"prevents":[167],"misclassification":[168],"loads,":[171],"resulting":[172],"improved":[174],"accuracy":[175],"detection.":[180]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W4400810264","counts_by_year":[],"updated_date":"2024-12-03T10:32:35.798412","created_date":"2024-07-20"}
