{"id":"https://openalex.org/W3128050662","doi":"https://doi.org/10.1109/access.2021.3057900","title":"Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient","display_name":"Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3128050662","doi":"https://doi.org/10.1109/access.2021.3057900","mag":"3128050662"},"language":"en","primary_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3057900","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09350273.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},"type":"article","type_crossref":"journal-article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09350273.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065141303","display_name":"Sami Salamin","orcid":"https://orcid.org/0000-0002-1044-7231"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sami Salamin","raw_affiliation_strings":["Department of Computer Science, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027765192","display_name":"Victor M. van Santen","orcid":"https://orcid.org/0000-0002-6629-4713"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Victor M. Van Santen","raw_affiliation_strings":["Department of Computer Science, University of Stuttgart, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017470419","display_name":"Martin Rapp","orcid":"https://orcid.org/0000-0002-5989-2950"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Martin Rapp","raw_affiliation_strings":["Department of Computer Science, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063508488","display_name":"J\u00f6rg Henkel","orcid":"https://orcid.org/0000-0001-9602-2922"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jorg Henkel","raw_affiliation_strings":["Department of Computer Science, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Department of Computer Science, University of Stuttgart, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institution_assertions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850,"provenance":"doaj"},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850,"provenance":"doaj"},"fwci":0.642,"has_fulltext":true,"fulltext_origin":"pdf","cited_by_count":9,"citation_normalized_percentile":{"value":0.999983,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":86,"max":88},"biblio":{"volume":"9","issue":null,"first_page":"30687","last_page":"30697"},"is_retracted":false,"is_paratext":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Atomic Layer Deposition Technology","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Atomic Layer Deposition Technology","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-Power VLSI Circuit Design and Optimization","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Nanoelectronics and Transistors","score":0.9999,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/guard","display_name":"Guard (computer science)","score":0.80337167},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.6518396},{"id":"https://openalex.org/keywords/metal-gate-transistors","display_name":"Metal Gate Transistors","score":0.554729},{"id":"https://openalex.org/keywords/double-gate-transistors","display_name":"Double-Gate Transistors","score":0.522705},{"id":"https://openalex.org/keywords/tunnel-field-effect-transistors","display_name":"Tunnel Field-Effect Transistors","score":0.518315},{"id":"https://openalex.org/keywords/cmos-scaling","display_name":"CMOS Scaling","score":0.507733},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.43402857}],"concepts":[{"id":"https://openalex.org/C141141315","wikidata":"https://www.wikidata.org/wiki/Q2379942","display_name":"Guard (computer science)","level":2,"score":0.80337167},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.6518396},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5890535},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.50820565},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45619896},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.44489306},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4404126},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.43402857},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38757896},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3583331},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35436106},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20275658},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10810062},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3057900","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09350273.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},{"is_oa":true,"landing_page_url":"https://publikationen.bibliothek.kit.edu/1000134664","pdf_url":"https://publikationen.bibliothek.kit.edu/1000134664/119689462","source":{"id":"https://openalex.org/S4306401992","display_name":"Repository KITopen (Karlsruhe Institute of Technology)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I102335020","host_organization_name":"Karlsruhe Institute of Technology","host_organization_lineage":["https://openalex.org/I102335020"],"host_organization_lineage_names":["Karlsruhe Institute of Technology"],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true}],"best_oa_location":{"is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2021.3057900","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/9312710/09350273.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.71,"display_name":"Affordable and clean energy"}],"grants":[],"datasets":[],"versions":[],"referenced_works_count":26,"referenced_works":["https://openalex.org/W100799738","https://openalex.org/W1533614470","https://openalex.org/W2027829345","https://openalex.org/W2034062945","https://openalex.org/W2040193438","https://openalex.org/W2061221729","https://openalex.org/W2098824871","https://openalex.org/W2128282513","https://openalex.org/W2147793529","https://openalex.org/W2159850878","https://openalex.org/W2160841000","https://openalex.org/W2169875292","https://openalex.org/W2218377381","https://openalex.org/W2291787259","https://openalex.org/W2294851045","https://openalex.org/W2333603443","https://openalex.org/W2346205343","https://openalex.org/W2346485801","https://openalex.org/W2400899949","https://openalex.org/W2532540554","https://openalex.org/W2540335859","https://openalex.org/W2591285794","https://openalex.org/W2729749234","https://openalex.org/W2788656907","https://openalex.org/W3024722044","https://openalex.org/W4249565978"],"related_works":["https://openalex.org/W4281694563","https://openalex.org/W4254637722","https://openalex.org/W4232799642","https://openalex.org/W2980401999","https://openalex.org/W2912082923","https://openalex.org/W2163182355","https://openalex.org/W2080696413","https://openalex.org/W2069427488","https://openalex.org/W1965165143","https://openalex.org/W1506140395"],"abstract_inverted_index":{"Self-Heating":[0],"Effects":[1],"(SHE)":[2],"is":[3,60],"known":[4],"as":[5],"one":[6],"of":[7],"the":[8,72],"key":[9],"reliability":[10],"challenges":[11],"in":[12],"FinFET":[13],"and":[14,67],"beyond.":[15],"Large":[16],"timing":[17,49,64],"guard":[18,50,65],"bands":[19],"are":[20],"necessary,":[21],"which":[22],"we":[23,30],"try":[24],"to":[25,39,52],"reduce.":[26],"In":[27],"this":[28],"work,":[29],"propose":[31],"operating":[32],"(biasing)":[33],"processors":[34],"at":[35,45],"Zero-Temperature":[36],"Coefficient":[37],"(ZTC)":[38],"contain":[40],"(mitigate)":[41],"SHE-induced":[42],"delay.":[43],"Operating":[44],"ZTC":[46],"allows":[47],"near-zero":[48],"band":[51,66],"protect":[53],"circuits":[54],"against":[55],"SHE.":[56],"However,":[57],"a":[58],"trade-off":[59],"found":[61],"between":[62],"thermal":[63],"performance":[68],"loss":[69],"from":[70],"lowering":[71],"voltage.":[73]},"cited_by_api_url":"https://api.openalex.org/works?filter=cites:W3128050662","counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2024-11-04T19:12:00.868581","created_date":"2021-02-15"}
