{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,27]],"date-time":"2024-10-27T04:06:28Z","timestamp":1730001988002,"version":"3.28.0"},"reference-count":31,"publisher":"MDPI AG","issue":"8","license":[{"start":{"date-parts":[[2023,8,12]],"date-time":"2023-08-12T00:00:00Z","timestamp":1691798400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"name":"Chongnqing Nature Science Foundation","award":["CSTB2002NSCQ-MSX1071"]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Entropy"],"abstract":"Low-illumination image enhancement technology is a topic of interest in the field of image processing. However, while improving image brightness, it is difficult to effectively maintain the texture and details of the image, and the quality of the image cannot be guaranteed. In order to solve this problem, this paper proposed a low-illumination enhancement method based on structural and detail layers. Firstly, we designed an SRetinex-Net model. The network is mainly divided into two parts: a decomposition module and an enhancement module. Second, the decomposition module mainly adopts the SU-Net structure, which is an unsupervised network that decomposes the input image into a structural layer image and detail layer image. Afterward, the enhancement module mainly adopts the SDE-Net structure, which is divided into two branches: the SDE-S branch and the SDE-D branch. The SDE-S branch mainly enhances and adjusts the brightness of the structural layer image through Ehnet and Adnet to prevent insufficient or overexposed brightness enhancement in the image. The SDE-D branch is mainly denoised and enhanced with textural details through a denoising module. This network structure can greatly reduce computational costs. Moreover, we also improved the total variation optimization model as a mixed loss function and added structural metrics and textural metrics as variables on the basis of the original loss function, which can well separate the structure edge and texture edge. Numerous experiments have shown that our structure has a more significant impact on the brightness and detail preservation of image restoration.<\/jats:p>","DOI":"10.3390\/e25081201","type":"journal-article","created":{"date-parts":[[2023,8,14]],"date-time":"2023-08-14T14:13:57Z","timestamp":1692022437000},"page":"1201","source":"Crossref","is-referenced-by-count":0,"title":["A Low-Illumination Enhancement Method Based on Structural Layer and Detail Layer"],"prefix":"10.3390","volume":"25","author":[{"given":"Wei","family":"Ge","sequence":"first","affiliation":[{"name":"National Demonstration Center for Experimental Electrical, School of Electronic and Information Engineering, Changchun University of Science and Technology, Changchun 130022, China"}]},{"given":"Le","family":"Zhang","sequence":"additional","affiliation":[{"name":"National Demonstration Center for Experimental Electrical, School of Electronic and Information Engineering, Changchun University of Science and Technology, Changchun 130022, China"}]},{"given":"Weida","family":"Zhan","sequence":"additional","affiliation":[{"name":"National Demonstration Center for Experimental Electrical, School of Electronic and Information Engineering, Changchun University of Science and Technology, Changchun 130022, China"}]},{"given":"Jiale","family":"Wang","sequence":"additional","affiliation":[{"name":"National Demonstration Center for Experimental Electrical, School of Electronic and Information Engineering, Changchun University of Science and Technology, Changchun 130022, China"}]},{"ORCID":"http:\/\/orcid.org\/0000-0002-1227-539X","authenticated-orcid":false,"given":"Depeng","family":"Zhu","sequence":"additional","affiliation":[{"name":"National Demonstration Center for Experimental Electrical, School of Electronic and Information Engineering, Changchun University of Science and Technology, Changchun 130022, China"}]},{"given":"Yang","family":"Hong","sequence":"additional","affiliation":[{"name":"National Demonstration Center for Experimental Electrical, School of Electronic and Information Engineering, Changchun University of Science and Technology, Changchun 130022, China"}]}],"member":"1968","published-online":{"date-parts":[[2023,8,12]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","unstructured":"Bhutto, J.A., Tian, L., Du, Q., Sun, Z., Yu, L., and Tahir, M.F. 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