{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T17:28:07Z","timestamp":1694626087100},"reference-count":66,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2006,8,1]],"date-time":"2006-08-01T00:00:00Z","timestamp":1154390400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2006,8]]},"DOI":"10.1109\/tim.2006.876523","type":"journal-article","created":{"date-parts":[[2006,7,21]],"date-time":"2006-07-21T23:20:02Z","timestamp":1153524002000},"page":"1106-1118","source":"Crossref","is-referenced-by-count":26,"title":["Space Compactor Design in VLSI Circuits Based on Graph Theoretic Concepts"],"prefix":"10.1109","volume":"55","author":[{"given":"S.","family":"Biswas","sequence":"first","affiliation":[]},{"given":"S.R.","family":"Das","sequence":"additional","affiliation":[]},{"given":"E.M.","family":"Petriu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1995.512147"},{"key":"ref38","first-page":"309","article-title":"Space compression method for built-in self-testing of VLSI circuits","volume":"3","author":"jone","year":"1991","journal-title":"Int J Comput Aided VLSI Des"},{"key":"ref33","first-page":"83","article-title":"Testing computer hardware through compression in space and time","author":"saluja","year":"1983","journal-title":"Proc Int Test Conf"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1987.5009452"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.818547"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/12.90252"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/12.46290"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/12.2271"},{"key":"ref35","first-page":"290","article-title":"Space compression method with output data modification","volume":"cad 6","author":"li","year":"1987","journal-title":"IEEE Trans Comput -Aided Design Integr Circuits Syst"},{"key":"ref34","first-page":"410","article-title":"A general scheme to optimize error masking in built-in self testing","author":"zorian","year":"1986","journal-title":"Proc Int Symp Fault-Tolerant Comput"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519510"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223683"},{"key":"ref61","author":"bron","year":"1972","journal-title":"Finding cliques in an undirected graph"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1145\/362342.362367"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/43.3166"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1016\/0045-7906(79)90002-8"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1987.295105"},{"key":"ref65","first-page":"21","article-title":"On the complexity and performance evaluation of a novel clique detection algorithm in undirected graphs","volume":"4","author":"das","year":"1980","journal-title":"Int J Policy Inform"},{"key":"ref66","author":"lee","year":"1982","journal-title":"On a family of novel clique detection algorithms and some studies on their performance characteristics and order of complexities in the context of existing algorithms"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/BF00137393"},{"key":"ref2","author":"mourad","year":"2000","journal-title":"Principles of Testing Electronic Systems"},{"key":"ref1","author":"rajsuman","year":"2000","journal-title":"System-on-a-Chip Design and Test"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743288"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674661"},{"key":"ref21","first-page":"3","article-title":"Check sum methods for test data compression","volume":"1","author":"hayes","year":"1976","journal-title":"J Des Autom Fault-Tolerant Comput"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675603"},{"key":"ref23","first-page":"2","article-title":"Signature analysis: A new digital field service method","volume":"28","author":"frohwerk","year":"1977","journal-title":"Hewlett-Packard J"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676357"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1983.1676204"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270904"},{"key":"ref51","first-page":"1","article-title":"Aliasing-free compaction in testing cores-based system-on-chip (SOC) using compatibility of response data outputs","volume":"8","author":"das","year":"2004","journal-title":"Trans SDPS"},{"key":"ref59","first-page":"946","article-title":"An efficient forward fault simulation algorithm based on the parallel pattern single fault propagation","author":"lee","year":"1991","journal-title":"Proc Int Test Conf"},{"key":"ref58","author":"lee","year":"1993","journal-title":"On the generation of test patterns for combinational circuits"},{"key":"ref57","author":"garey","year":"1979","journal-title":"Computers and Intractability A Guide to the Theory of NP-Completeness"},{"key":"ref56","author":"assaf","year":"2003","journal-title":"Digital core output test data compression architecture based on switching theory concepts"},{"key":"ref55","author":"chakrabarty","year":"1995","journal-title":"Test response compaction for built-in self testing"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.855085"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:20045050"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847352"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/54.211530"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313316"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.527992"},{"key":"ref12","first-page":"60","article-title":"Scan-based BIST with complete fault coverage and low hardware overhead","author":"wunderlich","year":"1996","journal-title":"Proc Euro Test Workshop"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639613"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/54.706034"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/54.706035"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/54.706037"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/43.856980"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/19.850413"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008355411566"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MC.1979.1658490"},{"key":"ref3","year":"2002","journal-title":"SOC (System-on-a-Chip) Testing for Plug and Play Test Automation"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1984.5005606"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675602"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1985.294865"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1985.294856"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041812"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/45.127641"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/19.989919"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/19.982974"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041774"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.858102"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/19.850416"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670851"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2001.928812"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843848"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/34720\/01658360.pdf?arnumber=1658360","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:46:46Z","timestamp":1638218806000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1658360\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006,8]]},"references-count":66,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2006,8]]}},"URL":"http:\/\/dx.doi.org\/10.1109\/tim.2006.876523","relation":{},"ISSN":["0018-9456"],"issn-type":[{"value":"0018-9456","type":"print"}],"subject":[],"published":{"date-parts":[[2006,8]]}}}
