{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,19]],"date-time":"2024-09-19T15:36:33Z","timestamp":1726760193474},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2015,1,1]],"date-time":"2015-01-01T00:00:00Z","timestamp":1420070400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2015]]},"DOI":"10.1109\/tii.2015.2396853","type":"journal-article","created":{"date-parts":[[2015,1,26]],"date-time":"2015-01-26T19:43:01Z","timestamp":1422301381000},"page":"1-1","source":"Crossref","is-referenced-by-count":54,"title":["Enhanced quality-related fault detection approach based on OSC and M-PLS"],"prefix":"10.1109","author":[{"given":"Guang","family":"Wang","sequence":"first","affiliation":[]},{"given":"Shen","family":"Yin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2012.09.004"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"168","DOI":"10.1002\/aic.11977","article-title":"Total projection to latent structures for process monitoring","volume":"56","author":"zhou","year":"2010","journal-title":"AIChE J"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(98)00109-9"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-128X(199701)11:1<73::AID-CEM435>3.0.CO;2-#"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7439(93)85002-X"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(99)00043-8"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1366\/0003702894202201"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1366\/0003702854248656"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/cem.700"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2005.03.003"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2014.03.004"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2014.2341934"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2006.11.018"},{"key":"ref5","author":"ding","year":"2008","journal-title":"Model-Based Fault Diagnosis Techniques Design Schemes Algorithms and Tools"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2167110"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2014.04.006"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2308133"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.009"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/7070852\/07021921.pdf?arnumber=7021921","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,6]],"date-time":"2024-06-06T20:47:25Z","timestamp":1717706845000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7021921\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/tii.2015.2396853","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015]]}}}
