{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,15]],"date-time":"2024-08-15T05:14:32Z","timestamp":1723698872391},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Basic Research Program of China","doi-asserted-by":"publisher","award":["2017YFA0207600"],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61622403","61621091"],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Joint Fund of Equipment Pre-Research and Ministry of Education","award":["6141A02022608"]},{"name":"Beijing National Research Center for Information Science and Technology"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/tcad.2018.2855145","type":"journal-article","created":{"date-parts":[[2018,7,12]],"date-time":"2018-07-12T18:58:24Z","timestamp":1531421904000},"page":"1611-1624","source":"Crossref","is-referenced-by-count":40,"title":["Fault-Tolerant Training Enabled by On-Line Fault Detection for RRAM-Based Neural Computing Systems"],"prefix":"10.1109","volume":"38","author":[{"ORCID":"http:\/\/orcid.org\/0000-0002-7731-7028","authenticated-orcid":false,"given":"Lixue","family":"Xia","sequence":"first","affiliation":[]},{"ORCID":"http:\/\/orcid.org\/0000-0002-6476-3061","authenticated-orcid":false,"given":"Mengyun","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Xuefei","family":"Ning","sequence":"additional","affiliation":[]},{"ORCID":"http:\/\/orcid.org\/0000-0003-4475-6435","authenticated-orcid":false,"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[]},{"ORCID":"http:\/\/orcid.org\/0000-0001-6108-5157","authenticated-orcid":false,"given":"Yu","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2018.2790840"},{"key":"ref38","first-page":"200","article-title":"A 4Mb embedded SLC resistive-RAM macro with 7.2ns read-write random-access time and 160ns MLC-access capability","author":"sheu","year":"2011","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2010.5556180"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2008.128"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062310"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0014"},{"key":"ref37","author":"lecun","year":"1998","journal-title":"The MNIST Database of Handwritten Digits"},{"key":"ref36","article-title":"Very deep convolutional networks for large-scale image recognition","volume":"abs 1409 1556","author":"simonyan","year":"2014","journal-title":"CoRR"},{"key":"ref35","author":"murphy","year":"2012","journal-title":"Machine Learning A Probabilistic Perspective"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488867"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2445741"},{"key":"ref11","article-title":"Deep compression: Compressing deep neural networks with pruning trained quantization and Huffman coding","author":"han","year":"2016","journal-title":"Proc Int Conf Learn Represent"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2394434"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_0549"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898010"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s11390-016-1608-8"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744900"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2017.7858419"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2573140"},{"key":"ref19","first-page":"260c","article-title":"A 462GOPs\/J RRAM-based nonvolatile intelligent processor for energy harvesting IoE system featuring nonvolatile logics and processing-in-memory","author":"su","year":"2017","journal-title":"Proc Symp VLSI Circuits"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2017.7858421"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2015.04.025"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7926952"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001139"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2017.55"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2013.219"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/nature14441"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1557\/adv.2016.377"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1149\/2.0061508ssl"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001140"},{"key":"ref9","first-page":"1097","article-title":"ImageNet classification with deep convolutional neural networks","author":"krizhevsky","year":"2012","journal-title":"Proc NIPS"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"144","DOI":"10.1038\/530144a","article-title":"The chips are down for Moore’s law","volume":"530","author":"waldrop","year":"2016","journal-title":"Nature"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838429"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062326"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2018.8297292"},{"key":"ref42","first-page":"338","article-title":"19.7 A 16Gb ReRAM with 200MB\/s write and 1GB\/s read in 27nm technology","author":"fackenthal","year":"2014","journal-title":"Proc IEEE Int Solid-State Circuits Conf (ISSCC)"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131539"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1145\/2678373.2665746"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.12"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783775"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898101"},{"key":"ref25","first-page":"20.3.1","article-title":"Understanding of the endurance failure in scaled HfO2-based 1T1R RRAM through vacancy mobility degradation","author":"chen","year":"2012","journal-title":"Proc IEDM"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/43\/8807328\/08410484.pdf?arnumber=8410484","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:14:51Z","timestamp":1657746891000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8410484\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":43,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2018.2855145","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,9]]}}}
