{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T05:17:57Z","timestamp":1719551877321},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T00:00:00Z","timestamp":1648771200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T00:00:00Z","timestamp":1648771200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T00:00:00Z","timestamp":1648771200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["405422836"],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2022,4,1]]},"DOI":"10.1109\/tc.2021.3066899","type":"journal-article","created":{"date-parts":[[2021,3,17]],"date-time":"2021-03-17T19:55:56Z","timestamp":1616010956000},"page":"947-958","source":"Crossref","is-referenced-by-count":20,"title":["On the Reliability of FeFET On-Chip Memory"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"http:\/\/orcid.org\/0000-0002-7175-7284","authenticated-orcid":false,"given":"Paul R.","family":"Genssler","sequence":"first","affiliation":[]},{"ORCID":"http:\/\/orcid.org\/0000-0002-6629-4713","authenticated-orcid":false,"given":"Victor M.","family":"van Santen","sequence":"additional","affiliation":[]},{"ORCID":"http:\/\/orcid.org\/0000-0001-9602-2922","authenticated-orcid":false,"given":"Jorg","family":"Henkel","sequence":"additional","affiliation":[]},{"ORCID":"http:\/\/orcid.org\/0000-0002-5649-3102","authenticated-orcid":false,"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131606"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268425"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2019.2931889"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2019.2930284"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2018.8388831"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2007.4337663"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IMW48823.2020.9108150"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1557\/mrs.2018.92"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2908084"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2930749"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838397"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/46\/7\/074001"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2070830"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/10584580108012885"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/00150193.2016.1162021"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2872347"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/5.0021081"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9129226"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2018.8510622"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IPDPS.2016.79"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993454"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2804938"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993474"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993551"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993469"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9128323"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2015.02.002"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2017.7939080"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2748992"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2896231"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2969383"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2283465"},{"key":"ref33","volume-title":"Emerging Memory Technologies: Design, Architecture, and Applications","author":"Xie","year":"2013"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/2024716.2024718"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/1186736.1186737"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105405"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2020.3028339"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM13553.2020.9371974"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062897"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2461592"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860603"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-1212-4_5"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3031249"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2889412"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2015.7127378"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/9732510\/09380995.pdf?arnumber=9380995","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T23:53:11Z","timestamp":1704844391000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9380995\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,4,1]]},"references-count":45,"journal-issue":{"issue":"4"},"URL":"http:\/\/dx.doi.org\/10.1109\/tc.2021.3066899","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"value":"0018-9340","type":"print"},{"value":"1557-9956","type":"electronic"},{"value":"2326-3814","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,4,1]]}}}
