{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T14:15:21Z","timestamp":1725804921080},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/iccvw.2017.203","type":"proceedings-article","created":{"date-parts":[[2018,1,22]],"date-time":"2018-01-22T17:42:32Z","timestamp":1516642952000},"page":"1734-1738","source":"Crossref","is-referenced-by-count":9,"title":["Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results"],"prefix":"10.1109","author":[{"given":"Mohamed","family":"Elawady","sequence":"first","affiliation":[]},{"given":"Christophe","family":"Ducottet","sequence":"additional","affiliation":[]},{"given":"Olivier","family":"Alata","sequence":"additional","affiliation":[]},{"given":"Cecile","family":"Barat","sequence":"additional","affiliation":[]},{"given":"Philippe","family":"Colantoni","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-48680-2_2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.381"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"508","DOI":"10.1007\/11744047_39","article-title":"Detecting symmetry and symmetric constellations of features","author":"loy","year":"2006","journal-title":"Computer Vision-ECCV 2006"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2013.155"},{"journal-title":"Technical Report","article-title":"First symmetry detection competition: Summary and results","year":"2011","author":"rauschert","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2012.6247954"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2017.03.022"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1986.4767851"}],"event":{"name":"2017 IEEE International Conference on Computer Vision Workshop (ICCVW)","start":{"date-parts":[[2017,10,22]]},"location":"Venice, Italy","end":{"date-parts":[[2017,10,29]]}},"container-title":["2017 IEEE International Conference on Computer Vision Workshops (ICCVW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8234943\/8265191\/08265413.pdf?arnumber=8265413","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,9]],"date-time":"2019-10-09T13:35:08Z","timestamp":1570628108000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8265413\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":8,"URL":"http:\/\/dx.doi.org\/10.1109\/iccvw.2017.203","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}
