{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T01:08:51Z","timestamp":1725584931633},"reference-count":2,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/drc50226.2020.9135159","type":"proceedings-article","created":{"date-parts":[[2020,7,8]],"date-time":"2020-07-08T20:46:18Z","timestamp":1594241178000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Modeling and Optimization of Advanced 3D NAND Memory"],"prefix":"10.1109","author":[{"given":"Mehdi","family":"Saremi","sequence":"first","affiliation":[]},{"given":"Ashish","family":"Pal","sequence":"additional","affiliation":[]},{"given":"Liu","family":"Jiang","sequence":"additional","affiliation":[]},{"given":"El Mehdi","family":"Bazizi","sequence":"additional","affiliation":[]},{"given":"Helen","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Xi-Wei","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Blessy","family":"Alexander","sequence":"additional","affiliation":[]},{"given":"Buvna","family":"Ayyagari-Sangamalli","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Sentaurus Device User Manual","year":"2018","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2017.2771956"}],"event":{"name":"2020 Device Research Conference (DRC)","start":{"date-parts":[[2020,6,21]]},"location":"Columbus, OH, USA","end":{"date-parts":[[2020,6,24]]}},"container-title":["2020 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9132184\/9135142\/09135159.pdf?arnumber=9135159","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:58:01Z","timestamp":1656345481000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9135159\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/drc50226.2020.9135159","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}
