{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,5]],"date-time":"2024-07-05T13:52:38Z","timestamp":1720187558527},"reference-count":27,"publisher":"Elsevier BV","issue":"8","content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Microprocessors and Microsystems"],"published-print":{"date-parts":[[2013,11]]},"DOI":"10.1016\/j.micpro.2013.08.008","type":"journal-article","created":{"date-parts":[[2013,9,11]],"date-time":"2013-09-11T22:15:31Z","timestamp":1378937731000},"page":"981-1001","update-policy":"http:\/\/dx.doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":12,"special_numbering":"PC","title":["DeSyRe: On-demand system reliability"],"prefix":"10.1016","volume":"37","author":[{"given":"I.","family":"Sourdis","sequence":"first","affiliation":[]},{"given":"C.","family":"Strydis","sequence":"additional","affiliation":[]},{"given":"A.","family":"Armato","sequence":"additional","affiliation":[]},{"given":"C.S.","family":"Bouganis","sequence":"additional","affiliation":[]},{"given":"B.","family":"Falsafi","sequence":"additional","affiliation":[]},{"given":"G.N.","family":"Gaydadjiev","sequence":"additional","affiliation":[]},{"given":"S.","family":"Isaza","sequence":"additional","affiliation":[]},{"given":"A.","family":"Malek","sequence":"additional","affiliation":[]},{"given":"R.","family":"Mariani","sequence":"additional","affiliation":[]},{"given":"D.","family":"Pnevmatikatos","sequence":"additional","affiliation":[]},{"given":"D.K.","family":"Pradhan","sequence":"additional","affiliation":[]},{"given":"G.","family":"Rauwerda","sequence":"additional","affiliation":[]},{"given":"R.M.","family":"Seepers","sequence":"additional","affiliation":[]},{"given":"R.A.","family":"Shafik","sequence":"additional","affiliation":[]},{"given":"K.","family":"Sunesen","sequence":"additional","affiliation":[]},{"given":"D.","family":"Theodoropoulos","sequence":"additional","affiliation":[]},{"given":"S.","family":"Tzilis","sequence":"additional","affiliation":[]},{"given":"M.","family":"Vavouras","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"issue":"6","key":"10.1016\/j.micpro.2013.08.008_b0005","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1109\/MM.2005.110","article-title":"Designing reliable systems from unreliable components: the challenges of transistor variability and degradation","volume":"25","author":"Borkar","year":"2005","journal-title":"IEEE Micro"},{"key":"10.1016\/j.micpro.2013.08.008_b0010","unstructured":"P. Hazucha, T. Karnik, J. Maiz, S. Walstra, B. Bloechel, J. Tschanz, G. Dermer, S. Hareland, P. Armstrong, S. Borkar, Neutron soft error rate measurements in a 90-nm CMOS process and scaling trends in SRAM from 0.25-\u03bcm to 90-nm generation, in: Electron Devices Meeting, 2003, IEEE International Technical Digest (IEDM), December 2003."},{"issue":"4","key":"10.1016\/j.micpro.2013.08.008_b0015","doi-asserted-by":"crossref","first-page":"322","DOI":"10.1109\/MDT.2008.107","article-title":"Reliable systems on unreliable fabrics","volume":"25","author":"Austin","year":"2008","journal-title":"IEEE Des. Test"},{"key":"10.1016\/j.micpro.2013.08.008_b0020","doi-asserted-by":"crossref","first-page":"937","DOI":"10.1109\/10.324525","article-title":"A telemetry-instrumentation system for monitoring multiple subcutaneously implanted glucose sensors","author":"Shults","year":"1994","journal-title":"IEEE Trans. Biomed. Eng."},{"issue":"7","key":"10.1016\/j.micpro.2013.08.008_b0025","doi-asserted-by":"crossref","first-page":"669","DOI":"10.1016\/S0956-5663(97)00025-0","article-title":"Implantation of a refillable glucose monitoring-telemetry device","volume":"12","author":"Atanasov","year":"1997","journal-title":"Biosens. Bioelectron."},{"key":"10.1016\/j.micpro.2013.08.008_b0030","unstructured":"International Technology Roadmap for Semiconductors.