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The mixed\u2010effects model is used to model degradation signals, and extended hazard model is used for the time\u2010to\u2010event data. The extended hazard is a general model which includes two well\u2010known hazard rate models, the Cox proportional hazards model and accelerated failure time model, as special cases. A two\u2010stage estimation approach is used to obtain model parameters, based on which remaining useful life for the in\u2010service unit can be predicted. The performance of the method is demonstrated through both simulation studies and a real case study.<\/jats:p>","DOI":"10.1002\/qre.2285","type":"journal-article","created":{"date-parts":[[2018,3,8]],"date-time":"2018-03-08T09:36:47Z","timestamp":1520501807000},"page":"748-758","source":"Crossref","is-referenced-by-count":11,"title":["Remaining useful life prediction for hard failures using joint model with extended hazard"],"prefix":"10.1002","volume":"34","author":[{"given":"Jianing","family":"Man","sequence":"first","affiliation":[{"name":"Department of Systems Engineering and Engineering Management City University of Hong Kong Hong Kong China"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-1348-8861","authenticated-orcid":false,"given":"Qiang","family":"Zhou","sequence":"additional","affiliation":[{"name":"Department of Systems and Industrial Engineering University of Arizona Tucson AZ USA"}]}],"member":"311","published-online":{"date-parts":[[2018,3,8]]},"reference":[{"key":"e_1_2_7_2_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.11.018"},{"key":"e_1_2_7_3_1","doi-asserted-by":"publisher","DOI":"10.1214\/088342306000000330"},{"key":"e_1_2_7_4_1","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2012.690930"},{"key":"e_1_2_7_5_1","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2016.1140922"},{"key":"e_1_2_7_6_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9469.2008.00622.x"},{"key":"e_1_2_7_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2044610"},{"key":"e_1_2_7_8_1","unstructured":"CelayaJ SaxenaA SahaS GoebelKF.Prognostics of power mosfets under thermal stress accelerated aging using data\u2010driven and model\u2010based methodologies.Annual Conference of the Prognostics and Health ManagementSociety2011."},{"key":"e_1_2_7_9_1","unstructured":"LiaoH ZhaoW GuoH.Predicting remaining useful life of an individual unit using proportional hazards model and logistic regression model.Reliability and Maintainability Symposium 2006. 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