ARXPS

Thus, with ARXPS, the spectroscopist is able to determine the degree to which a composition of elements measured is either intermingled or segregated and layered at the surface of a material.

Nondestructive ARXPS can be a valuable tool for measuring thin films on metals, surface segregation in polymers, the amount and depth that surface treatments impart on metals and polymers, as well as clarifying the presence of contaminants on a surface that would disrupt bonding.

In this case, ARXPS cannot be utilized to measure layer thickness, and destructive methods such as sputter depth profiling need to be employed to determine chemical composition as a function of depth.